• DocumentCode
    566271
  • Title

    High frequency signal transmission characteristics of cone bump interconnections

  • Author

    Ikeda, A. ; Watanabe, N. ; Asano, T.

  • Author_Institution
    Grad. Sch. of Inf. Sci. & Electr. Eng., Kyushu Univ., Fukuoka, Japan
  • fYear
    2012
  • fDate
    Jan. 31 2012-Feb. 2 2012
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    We evaluated high frequency signal transmission characteristics of coplanar waveguides fabricated using Au cone bump interconnections. Electroless Ni / Au bumps were used as counter-electrodes against the Au cone bumps. The signal transmission loss increased with the number of bump interconnections. At 40 GHz, the signal insertion loss due to the bump interconnections was 0.017 dB / bump with the 10 μm square size Ni / Au bumps. This value was small enough for application to radio-frequency devices. While, with the 5 μm square size Ni / Au bumps, open failure was observed between the bump interconnections. The open failure might be caused by decreasing of the contact pressure between the bumps, due to the mushroom-like shape of the Ni / Au bumps.
  • Keywords
    coplanar waveguides; gold; integrated circuit interconnections; nickel; Ni-Au; contact pressure; coplanar waveguides; counter-electrodes; electroless nickel-gold bumps; frequency 40 GHz; gold cone bump interconnections; high-frequency signal transmission characteristics; loss 0.017 dB; radiofrequency devices; signal insertion loss; signal transmission loss; size 10 mum; size 5 mum; Bonding; Coplanar waveguides; Flip chip; Gold; Nickel; Propagation losses; Substrates; 3D ingegration; cone bump; coplanar waveguide; flip chip; high-frequency signal transmission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    3D Systems Integration Conference (3DIC), 2011 IEEE International
  • Conference_Location
    Osaka
  • Print_ISBN
    978-1-4673-2189-1
  • Type

    conf

  • DOI
    10.1109/3DIC.2012.6263011
  • Filename
    6263011