DocumentCode :
56664
Title :
Fast Contour Integral Equation Method for Wideband Power Integrity Analysis
Author :
Huapeng Zhao ; En-Xiao Liu ; Jun Hu ; Er-Ping Li
Author_Institution :
Dept. of Electron. & Photonics, Inst. of High Performance Comput., Singapore, Singapore
Volume :
4
Issue :
8
fYear :
2014
fDate :
Aug. 2014
Firstpage :
1317
Lastpage :
1324
Abstract :
The contour integral equation method has been used for system-level power integrity analysis of electronic packages. But, wideband simulation of complex package structures necessitates a fast contour integral equation (CIE) method. For this purpose, we propose both a priori and a posteriori approaches to speed up the CIE method for fast wideband simulation of power ground planes. First, the speedup is achieved by means of a priori approach, i.e., fast matrix filling using Hankel function interpolation. Second, a posteriori approach using the vector-fitting-based adaptive frequency sampling is combined with the CIE method for fast wideband analysis. We specifically propose an automatic band split algorithm to confine the order of the vector fitting model and ensure fast model convergence. Numerical and experimental results are presented to validate the accuracy and demonstrate the efficiency of the proposed acceleration techniques.
Keywords :
Hankel matrices; electronics packaging; integral equations; interpolation; Hankel function interpolation; a posteriori approach; a priori approach; acceleration technique; automatic band split algorithm; complex package structures; electronic packages; fast CIE method; fast contour integral equation method; fast matrix filling; fast wideband simulation; power ground planes; system-level power integrity analysis; vector-fitting-based adaptive frequency sampling; wideband power integrity analysis; wideband simulation; Acceleration; Adaptation models; Integrated circuit modeling; Interpolation; Mathematical model; Vectors; Wideband; Adaptive frequency sampling; automatic band split; contour integral equation (CIE); fast matrix filling; power ground plane pair; vector fitting; wideband analysis; wideband analysis.;
fLanguage :
English
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
2156-3950
Type :
jour
DOI :
10.1109/TCPMT.2014.2327242
Filename :
6837426
Link To Document :
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