• DocumentCode
    56664
  • Title

    Fast Contour Integral Equation Method for Wideband Power Integrity Analysis

  • Author

    Huapeng Zhao ; En-Xiao Liu ; Jun Hu ; Er-Ping Li

  • Author_Institution
    Dept. of Electron. & Photonics, Inst. of High Performance Comput., Singapore, Singapore
  • Volume
    4
  • Issue
    8
  • fYear
    2014
  • fDate
    Aug. 2014
  • Firstpage
    1317
  • Lastpage
    1324
  • Abstract
    The contour integral equation method has been used for system-level power integrity analysis of electronic packages. But, wideband simulation of complex package structures necessitates a fast contour integral equation (CIE) method. For this purpose, we propose both a priori and a posteriori approaches to speed up the CIE method for fast wideband simulation of power ground planes. First, the speedup is achieved by means of a priori approach, i.e., fast matrix filling using Hankel function interpolation. Second, a posteriori approach using the vector-fitting-based adaptive frequency sampling is combined with the CIE method for fast wideband analysis. We specifically propose an automatic band split algorithm to confine the order of the vector fitting model and ensure fast model convergence. Numerical and experimental results are presented to validate the accuracy and demonstrate the efficiency of the proposed acceleration techniques.
  • Keywords
    Hankel matrices; electronics packaging; integral equations; interpolation; Hankel function interpolation; a posteriori approach; a priori approach; acceleration technique; automatic band split algorithm; complex package structures; electronic packages; fast CIE method; fast contour integral equation method; fast matrix filling; fast wideband simulation; power ground planes; system-level power integrity analysis; vector-fitting-based adaptive frequency sampling; wideband power integrity analysis; wideband simulation; Acceleration; Adaptation models; Integrated circuit modeling; Interpolation; Mathematical model; Vectors; Wideband; Adaptive frequency sampling; automatic band split; contour integral equation (CIE); fast matrix filling; power ground plane pair; vector fitting; wideband analysis; wideband analysis.;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-3950
  • Type

    jour

  • DOI
    10.1109/TCPMT.2014.2327242
  • Filename
    6837426