Title :
The failure-tolerant analog-digital converter with built-in means of self-checking and its modeling in the environment of LabVIEW
Author :
Michail, Seluyanov
Author_Institution :
MSTU MIREA, Moscow, Russia
Abstract :
The paper describes the failover ADC with self-checking. The examples are considered of building virtual models of fault-tolerant ADC. Provides an assessment of the self-checking of the ADC. It is shown that the implementation of the proposed structures ADC increases the mean time between failure and reduces maintenance costs.
Keywords :
analogue-digital conversion; fault tolerant computing; virtual instrumentation; LabVIEW; failover ADC; failure-tolerant analog-digital converter; fault-tolerant ADC; maintenance costs reduction; self-checking; virtual models; Adaptation models; Computational modeling; Embedded computing; Fault tolerance; Fault tolerant systems; Integrated circuit modeling; Switches; analog-digital converter; fault tolerance; modeling; self-checking; virtual device;
Conference_Titel :
Embedded Computing (MECO), 2012 Mediterranean Conference on
Conference_Location :
Bar
Print_ISBN :
978-1-4673-2366-6