• DocumentCode
    566706
  • Title

    The failure-tolerant analog-digital converter with built-in means of self-checking and its modeling in the environment of LabVIEW

  • Author

    Michail, Seluyanov

  • Author_Institution
    MSTU MIREA, Moscow, Russia
  • fYear
    2012
  • fDate
    19-21 June 2012
  • Firstpage
    239
  • Lastpage
    242
  • Abstract
    The paper describes the failover ADC with self-checking. The examples are considered of building virtual models of fault-tolerant ADC. Provides an assessment of the self-checking of the ADC. It is shown that the implementation of the proposed structures ADC increases the mean time between failure and reduces maintenance costs.
  • Keywords
    analogue-digital conversion; fault tolerant computing; virtual instrumentation; LabVIEW; failover ADC; failure-tolerant analog-digital converter; fault-tolerant ADC; maintenance costs reduction; self-checking; virtual models; Adaptation models; Computational modeling; Embedded computing; Fault tolerance; Fault tolerant systems; Integrated circuit modeling; Switches; analog-digital converter; fault tolerance; modeling; self-checking; virtual device;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Embedded Computing (MECO), 2012 Mediterranean Conference on
  • Conference_Location
    Bar
  • Print_ISBN
    978-1-4673-2366-6
  • Type

    conf

  • Filename
    6268968