Title :
Reliability evaluation based on DAD using non-stationary time series method
Author :
Wang, Li ; Zhang, Huiyan ; Xue, Hong
Author_Institution :
Sch. of Comput. & Inf. Eng., Beijing Technol. & Bus. Univ., Beijing, China
Abstract :
For taking into account implements of stochastic nature of environmental variables in reliability evaluation of Degradation Test (DT), this paper proposes a new DT reliability evaluation method based on Degradation Amount Distribution (DAD) using non-stationary time series analysis. A DT of a certain electronic product is conducted, and product reliability evaluation is obtained by the suggested method. The results show that the suggested reliability evaluation method is more reasonable than traditional reliability evaluation method.
Keywords :
Degradation Amount Distribution; Degradation Test; Non-Stationary Time Series; Reliability Evaluation;
Conference_Titel :
Measurement, Information and Control (MIC), 2012 International Conference on
Conference_Location :
Harbin, China
Print_ISBN :
978-1-4577-1601-0
DOI :
10.1109/MIC.2012.6273309