DocumentCode :
567112
Title :
Reliability evaluation based on DAD using non-stationary time series method
Author :
Wang, Li ; Zhang, Huiyan ; Xue, Hong
Author_Institution :
Sch. of Comput. & Inf. Eng., Beijing Technol. & Bus. Univ., Beijing, China
Volume :
1
fYear :
2012
fDate :
18-20 May 2012
Firstpage :
102
Lastpage :
106
Abstract :
For taking into account implements of stochastic nature of environmental variables in reliability evaluation of Degradation Test (DT), this paper proposes a new DT reliability evaluation method based on Degradation Amount Distribution (DAD) using non-stationary time series analysis. A DT of a certain electronic product is conducted, and product reliability evaluation is obtained by the suggested method. The results show that the suggested reliability evaluation method is more reasonable than traditional reliability evaluation method.
Keywords :
Degradation Amount Distribution; Degradation Test; Non-Stationary Time Series; Reliability Evaluation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Measurement, Information and Control (MIC), 2012 International Conference on
Conference_Location :
Harbin, China
Print_ISBN :
978-1-4577-1601-0
Type :
conf
DOI :
10.1109/MIC.2012.6273309
Filename :
6273309
Link To Document :
بازگشت