Title :
Nanopower CMOS Relaxation Oscillators With Sub-100
Temperature Coefficient
Author :
Yu-Hsuan Chiang ; Shen-Iuan Liu
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
A low temperature coefficient (TC) current reference and a curvature current source are realized by transistors with different gate-oxide thicknesses. These two current sources are used to realize oscillators with low TCs. These two oscillators of 1.4 MHz and 28 kHz, respectively, are fabricated in the 0.18-μm CMOS process, and their areas are 0.072 and 0.16 mm2, respectively. For the 1.4-MHz oscillator, its power is 615 nW with a supply voltage of 1.2 V. The measured average TC is 56.4 ppm/°C for a temperature of -20 °C to 80 °C. The calculated figures of merit (FOM1 and FOM2) are -131 and 103 dB, respectively. For the 28-kHz oscillator, its power is 40.2 nW with a supply voltage of 1.2 V. The measured average TC is 95.5 ppm/°C for a temperature of -20 °C to 80 °C. The calculated FOM2 is 92 dB.
Keywords :
CMOS integrated circuits; constant current sources; reference circuits; relaxation oscillators; current reference; curvature current source; frequency 1.4 MHz; frequency 28 kHz; gate-oxide thickness; low temperature coefficient; nanopower CMOS relaxation oscillators; power 40.2 nW; power 615 nW; size 0.18 mum; temperature -20 degC to 80 degC; transistors; voltage 1.2 V; Clocks; Integrated circuits; Logic gates; Oscillators; Resistors; Temperature measurement; Transistors; Low power; relaxation oscillator; subthreshold; temperature coefficient (TC);
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
DOI :
10.1109/TCSII.2014.2331110