DocumentCode
567968
Title
Crystallization to polycrystalline silicon films by underwater laser annealing and its application to thin film transistors
Author
Machida, Emi ; Horita, Masahiro ; Ishikawa, Yasuaki ; Uraoka, Yukiharu ; Ikenoue, Hiroshi
Author_Institution
Grad. Sch. of Mater. Sci., Nara Inst. of Sci. & Technol., Ikoma, Japan
fYear
2012
fDate
4-6 July 2012
Firstpage
111
Lastpage
114
Abstract
We performed crystallization of an amorphous silicon by laser irradiation in flowing deionized-water where Nd: YAG THG laser (wave length = 355 nm) was used for annealing. As the results, we demonstrated that the underwater laser annealing (WLA) leads to giant- and uniform-grain growth as compared to laser annealing in air (LA). It is thought that the homogenization of the temperature distribution within the Si films enhances grain growth. In addition, we successfully fabricated the poly-Si TFTs with the use of WLA poly-Si as the channel layer. The output and the transfer characteristics were clearly obtained, and thus we succeeded in the TFT operation.
Keywords
amorphous semiconductors; chemical vapour deposition; crystallisation; elemental semiconductors; grain growth; laser beam annealing; laser beam effects; semiconductor thin films; silicon; temperature distribution; thin film transistors; Nd:YAG THG laser; Si; amorphous silicon; channel layer; crystallization; deionized water; grain growth; laser irradiation; polycrystalline silicon films; temperature distribution; thin film transistors; transfer characteristics; underwater laser annealing; uniform-grain growth; Annealing; Films; Grain size; Laser beams; Lasers; Silicon; Thin film transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Active-Matrix Flatpanel Displays and Devices (AM-FPD), 2012 19th International Workshop on
Conference_Location
Kyoto
Print_ISBN
978-1-4673-0399-6
Type
conf
Filename
6294856
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