DocumentCode :
568020
Title :
Low-temperature solution process for oxide TFT
Author :
Jeong, Woong Hee ; Kim, Dong Lim ; Kim, Hyun Jae
Author_Institution :
Sch. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea
fYear :
2012
fDate :
4-6 July 2012
Firstpage :
301
Lastpage :
304
Abstract :
The importance of the low-temperature solution process for oxide thin-film transistor (TFT) is growing as the demand on the ultra-large and flexible display is increased. Among diverse approaches for the low-temperature solution process, the formation of dual active layer and utilization of nitrate precursor are proposed in this paper. From electrical and structural analyses, the two proposed approaches proved their competence as effective solutions to achieve high performance TFT in low-temperature annealing below 350°C.
Keywords :
annealing; liquid phase deposition; thin film transistors; thin films; dual active layer formation; effective solutions; electrical analysis; flexible display; high performance thin-film transistor; low-temperature annealing; low-temperature solution process; nitrate precursor utilization; oxide thin-film transistor; structural analysis; ultralarge display; Annealing; Films; Iron; Temperature; Thin film transistors; Zinc;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Active-Matrix Flatpanel Displays and Devices (AM-FPD), 2012 19th International Workshop on
Conference_Location :
Kyoto
Print_ISBN :
978-1-4673-0399-6
Type :
conf
Filename :
6294910
Link To Document :
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