• DocumentCode
    568605
  • Title

    PTL: PCM Translation Layer

  • Author

    Shao, Zili ; Chang, Naehyuck ; Dutt, Nikil

  • Author_Institution
    Dept. of Comput., Hong Kong Polytech. Univ., Hong Kong, China
  • fYear
    2012
  • fDate
    19-21 Aug. 2012
  • Firstpage
    380
  • Lastpage
    385
  • Abstract
    PCM (Phase Change Memory) has been used as NOR flash replacement in embedded systems, and poses interesting system-level challenges for transparent exploitation of these memory structures by embedded systems software. We propose such a system-level transparent framework, called PTL (PCM Translation Layer), to efficiently manage PCM. PTL´s translation layer conceals the physical constraints of the PCM architecture so that embedded systems software can use PCMs in a transparent manner, while efficiently exploiting the idiosyncrasies of the PCM architecture. We study the requirements for transparently managing PCM in embedded systems, and propose the system architecture of PTL. As a case study, we propose a simple yet effective wear leaveling technique by exploiting application-specific features in embedded systems. The experimental results show that our wear leveling technique can effectively improve the lifetime of PCM chips compared with the previous work. We expect this work can serve as a first step towards the full exploration of PCM in embedded systems.
  • Keywords
    NOR circuits; embedded systems; flash memories; phase change memories; NOR flash replacement; PCM architecture; PCM translation layer; PTL system architecture; embedded system software; memory structures; phase change memory; system-level transparent framework; wear leaveling technique; Ash; Bandwidth; Computer architecture; Embedded systems; Phase change materials; Random access memory; PCM (Phase Change Memory);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI (ISVLSI), 2012 IEEE Computer Society Annual Symposium on
  • Conference_Location
    Amherst, MA
  • ISSN
    2159-3469
  • Print_ISBN
    978-1-4673-2234-8
  • Type

    conf

  • DOI
    10.1109/ISVLSI.2012.75
  • Filename
    6296503