Title :
Measurement of independent piezoelectric constants of a Ca3TaGa3Si2O14 crystal by x-ray diffraction method
Author :
Irzhak, D. ; Roshchupkin, D. ; Fahrtdinov, R.
Author_Institution :
X-ray Acoustooptics Laboratoty, Inst. of Microelectron. Technol. & High-Purity Mater., Chernogolovka, Russia
Abstract :
This work presents the results of independent piezoelectric constants measurements for calcium-tantalum gallosilicate (Ca3TaGa3Si2O14, CTGS) using double-crystal x-ray diffractometry. It is shown that one and the same sample can be used to measure all independent piezoconstants of the CTGS crystal. The measured values of the piezomoduli are d11 = - 3.7098 · 10-12 C N-1 and d14 = 24.29 · 10-12 C N-1. Under the conditions of the experiment the measurement error was 3%.
Keywords :
X-ray diffraction; calcium compounds; crystal structure; gallium compounds; piezoelectric materials; piezoelectricity; tantalum compounds; Ca3TaGa3Si2O14; calcium-tantalum gallosilicate; double-crystal X-ray diffraction; independent piezoelectric constants; piezomoduli; Crystals; Electric fields; Geometry; Reflection; Tensile stress; X-ray diffraction; piezoelectric crystal; x-ray diffraction;
Conference_Titel :
Applications of Ferroelectrics held jointly with 2012 European Conference on the Applications of Polar Dielectrics and 2012 International Symp Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials (ISAF/ECAPD/PFM), 2012 Intl Symp
Conference_Location :
Aveiro
Print_ISBN :
978-1-4673-2668-1
DOI :
10.1109/ISAF.2012.6297796
