Fe valence determination in doped SrTiO3 epitaxial films

Author

Kajewski, D. ; Szade, J. ; Kubacki, J. ; Szot, K. ; Köhl, A. ; Lenser, Ch ; Dittmann, R.

Author_Institution

Inst. of Phys., Univ. of Silesia, Katowice, Poland

fYear

2012

fDate

9-13 July 2012

Firstpage

1

Lastpage

3

Abstract

Atomic Force Microscopy (AFM) measurements have been performed for Fe doped SrTiO₃ thin films with an Fe concentration of 2 and 5 at%. Thin films with a thickness of about 20 nm were grown by pulsed laser deposition on single crystalline SrTi_0.99Nb_0.01O₃ substrates. Low-energy electron diffraction examination showed that the films are single crystalline. The regions treated with the AFM tip (applied dc voltage up to 6V) showed inhomogeneity of the electrical conductivity.

Keywords

atomic force microscopy; doping; electrical conductivity; epitaxial layers; iron; low energy electron diffraction; pulsed laser deposition; strontium compounds; valence bands; AFM; SrTi_0.99Nb_0.01O₃; SrTiO₃:Fe; applied dc voltage; atomic force microscopy; electrical conductivity; iron doped strontium titanate thin films; iron valence determination; low energy electron diffraction; pulsed laser deposition; single crystalline strontium titanium niobates substrate; strontium titanate epitaxial films; Conductivity; Crystals; Films; Iron; Switches; Temperature measurement; LC-AFM; SrTiO3; XAS; resonant photoemision;

fLanguage

English

Publisher

ieee

Conference_Titel

Applications of Ferroelectrics held jointly with 2012 European Conference on the Applications of Polar Dielectrics and 2012 International Symp Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials (ISAF/ECAPD/PFM), 2012 Intl Symp

Conference_Location

Aveiro

Print_ISBN

978-1-4673-2668-1

Type

conf

DOI

10.1109/ISAF.2012.6297843

Filename

6297843