Title :
Degradation failure model of electromagnetic relay
Author :
Ye Xuerong ; Ma Yue ; Meng Hang ; Zhai Guofu
Author_Institution :
Sch. of Electr. Eng. & Autom., Harbin Inst. of Tech., Harbin, China
Abstract :
Electromagnetic relay (EMR) is a kind of high failure rate component in control system, the accuracy of its reliability prediction plays a significant role in the system reliability estimation. Currently, post-analysis methods didn´t consider the influence of different application environment of EMR, only using some coefficients to revise the prediction results. In fact, the failure process and failure mechanisms of EMR may totally change along with the environment. This paper collects the failure process data of EMR, and studies the degradation characteristics under different failure mode, finally establishes and proposes the regression degradation model and the failure physical degradation model of relay contacts respectively, and verifies the accuracy through the life prediction based on the model.
Keywords :
electromagnetic devices; failure analysis; regression analysis; relays; reliability; control system; degradation failure model; electromagnetic relay; failure physical degradation; life prediction; regression degradation; reliability estimation; reliability prediction; degradation failure model; failure mechanisms; physics of failure; relay;
Conference_Titel :
Electrical Contacts (ICEC 2012), 26th International Conference on
Conference_Location :
Beijing
Electronic_ISBN :
978-1-84919-508-9
DOI :
10.1049/cp.2012.0633