DocumentCode :
569905
Title :
The Bayesian analysis of reliability of zero-failure data
Author :
Jin Shaohua ; Lu Jianguo ; Wan Yanping ; Sun Shuguang ; Chen Xiuyin
Author_Institution :
Hebei Univ. of Technol., Tianjin, China
fYear :
2012
fDate :
14-17 May 2012
Firstpage :
439
Lastpage :
442
Abstract :
In the reliability test of the products of electrical apparatus, zero-failure data is usually faced. For the existing reliability theory based on the analysis of failure data, how to make an analysis of the reliability of the products of electrical apparatus under the condition of zero-failure is an issue with a certain degree of difficulty. In this paper, when failure probability pi´s prior density kernel of Zero-failure data (ti ,ni) is exp[a(1-pi)] in time ti, the reliability estimation of the products of electrical apparatus is obtained by Bayesian theorem. An actual test data is computed by using the proposed method. It turns out that the proposed method accords with the engineering priors.
Keywords :
Bayes methods; electrical products; estimation theory; failure analysis; power apparatus; reliability theory; Bayesian analysis; electrical apparatus products; failure data analysis; failure probability; reliability estimation; reliability test; zero-failure data; Bayesian estimation; failure probabilit; reliability; zero-failure data;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Electrical Contacts (ICEC 2012), 26th International Conference on
Conference_Location :
Beijing
Electronic_ISBN :
978-1-84919-508-9
Type :
conf
DOI :
10.1049/cp.2012.0692
Filename :
6301937
Link To Document :
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