Title :
Binary mask estimation for voiced speech segregation using Bayesian method
Author :
Liang, Shan ; Liu, Wenju
Author_Institution :
Nat. Lab. of Pattern Recognition, Inst. of Autom., Beijing, China
Abstract :
The ideal binary mask (IBM) estimation has been set as the computational goal of Computational auditory scene analysis (CASA). A lot of effort has been made in the IBM estimation via statistical learning method. The current Bayesian methods usually estimate the mask value of each time-frequency (T-F) unit independently with only local auditory features. In this paper, we propose a new Bayesian approach. First, a set of pitch-based auditory features are summarized to exploit the inherent characteristics of the reliable and unreliable time-frequency (T-F) units. A rough estimation is obtained according to Maximum Likelihood (ML) rule. Then, we propose a prior model which is derived from onset/offset segmentation to improve the estimation. Finally, an efficient Markov Chain Monte Carlo (MCMC) procedure is applied to approach the maximum a posterior (MAP) estimation. Proposed method is evaluated on Cooke´s 100 mixtures and compared with previous model. Experiments show that our method performs better.
Keywords :
Bayes methods; Markov processes; Monte Carlo methods; maximum likelihood estimation; speech processing; time-frequency analysis; Bayesian method; Markov Chain Monte Carlo procedure; computational auditory scene analysis; ideal binary mask estimation; local auditory feature; maximum a posterior estimation; maximum likelihood rule; offset segmentation; onset segmentation; pitch-based auditory feature; rough estimation; statistical learning method; time-frequency unit; voiced speech segregation; Bayesian methods; Mathematical model; Maximum likelihood estimation; Reliability; Signal to noise ratio; Speech; Bayesian Estimation; Ideal Binary Mask (IBM); Markov Chain Monte Carlo (MCMC);
Conference_Titel :
Pattern Recognition (ACPR), 2011 First Asian Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4577-0122-1
DOI :
10.1109/ACPR.2011.6305053