Title :
Innovative methodology for failure rate estimation from quality incidents, for ISO26262 standard requirements
Author :
Bergès, C. ; Chandon, Y. ; Gubian, R.
Author_Institution :
Freescale Semicond. SAS, Toulouse, France
Abstract :
For the new ISO26262 standard deployment into the Automotive industry, failure rate estimation becomes a key issue to design new electronic products. The `IEEE1413.1 Guide for Selecting and Using Reliability Predictions´ has identified difficulties to work from field returns. We present an innovative methodology addressing these issues for integrated circuits, using mathematic and statistical tools applied to real data.
Keywords :
ISO standards; failure analysis; innovation management; ISO26262 standard deployment; ISO26262 standard requirements; automotive industry; electronic products; failure rate estimation; innovative methodology; integrated circuits; mathematic; quality incident; reliability prediction; statistical tool; Automotive engineering; Data models; Estimation; Failure analysis; Manufacturing; Mathematical model; Standards;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits (IPFA), 2012 19th IEEE International Symposium on the
Conference_Location :
Singapore
Print_ISBN :
978-1-4673-0980-6
DOI :
10.1109/IPFA.2012.6306281
