DocumentCode
571861
Title
Innovative methodology for failure rate estimation from quality incidents, for ISO26262 standard requirements
Author
Bergès, C. ; Chandon, Y. ; Gubian, R.
Author_Institution
Freescale Semicond. SAS, Toulouse, France
fYear
2012
fDate
2-6 July 2012
Firstpage
1
Lastpage
6
Abstract
For the new ISO26262 standard deployment into the Automotive industry, failure rate estimation becomes a key issue to design new electronic products. The `IEEE1413.1 Guide for Selecting and Using Reliability Predictions´ has identified difficulties to work from field returns. We present an innovative methodology addressing these issues for integrated circuits, using mathematic and statistical tools applied to real data.
Keywords
ISO standards; failure analysis; innovation management; ISO26262 standard deployment; ISO26262 standard requirements; automotive industry; electronic products; failure rate estimation; innovative methodology; integrated circuits; mathematic; quality incident; reliability prediction; statistical tool; Automotive engineering; Data models; Estimation; Failure analysis; Manufacturing; Mathematical model; Standards;
fLanguage
English
Publisher
ieee
Conference_Titel
Physical and Failure Analysis of Integrated Circuits (IPFA), 2012 19th IEEE International Symposium on the
Conference_Location
Singapore
ISSN
1946-1542
Print_ISBN
978-1-4673-0980-6
Type
conf
DOI
10.1109/IPFA.2012.6306281
Filename
6306281
Link To Document