Title :
Space Domain Reflectometry for open failure localization
Author :
Gaudestad, Jan ; Talanov, Vladimir ; Gagliolo, Nicolas ; Orozco, Antonio
Author_Institution :
Neocera, LLC, Beltsville, MD, USA
Abstract :
Space Domain Reflectometry (SDR) is a newly developed non-destructive failure analysis (FA) technique for localizing open defects through the imaging of magnetic field produced by a radio frequency (RF) current induced in the sample. The technique employs a Scanning Superconducting Quantum Interference Device (SQUID) RF Microscope and is capable of locating open failures with 30μm accuracy. Here we present a theory of SDR and show examples of locating opens in various integrated circuit (IC) package samples.
Keywords :
SQUIDs; failure analysis; integrated circuit packaging; reflectometry; SQUID RF Microscope; integrated circuit package; magnetic field; nondestructive failure analysis; open defects; open failure localization; radio frequency current; scanning superconducting quantum interference device; space domain reflectometry; Magnetic domains; Magnetic fields; Magnetic resonance imaging; Radio frequency; SQUIDs; Sensors;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits (IPFA), 2012 19th IEEE International Symposium on the
Conference_Location :
Singapore
Print_ISBN :
978-1-4673-0980-6
DOI :
10.1109/IPFA.2012.6306311
