• DocumentCode
    571882
  • Title

    The Auger chemical state analysis on leadframe surface contamination

  • Author

    Zakaria, Nurhanani

  • Author_Institution
    Infineon Technologies (Kulim) Sdn.Bhd., Lot 10 & 11, Industrial Zone Phase II, Kulim Hi-Tech Park, 09000, Kedah, Malaysia
  • fYear
    2012
  • fDate
    2-6 July 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper discusses applications of Auger Electron Spectroscopy (AES) chemical state analysis to analyze the wirebond non-stick on leadframe (NSOL) issue. Results showed higher oxidation level for problematic leafdrame which revealed presence of Zinc Oxide and Chromium Oxide.
  • Keywords
    IEEE Xplore; Portable document format;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Physical and Failure Analysis of Integrated Circuits (IPFA), 2012 19th IEEE International Symposium on the
  • Conference_Location
    Singapore
  • ISSN
    1946-1542
  • Print_ISBN
    978-1-4673-0980-6
  • Type

    conf

  • DOI
    10.1109/IPFA.2012.6306317
  • Filename
    6306317
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=571882