Title :
Signal propagation analysis by Digital Lock-in Time Resolved Imaging
Author :
Bascoul, Guillaume ; Perdu, Philippe ; Lewis, Dean
Author_Institution :
CNES, DCT/AQ/LE, Toulouse, France
Abstract :
Time Resolved Imaging (TRI) allows real time imaging of transitions in CMOS gates. This technique has been validated down to low power 45 nm technology. TRI is very useful to analyze signal propagation after a clock edge. Nevertheless, TRI dimensional (x, y, t) data are not well adapted for direct visualization of propagation times: (x, y, t) data allows either a movie output or a slice by slice visualization for each time step or a chosen spot chronograms. To overcome these limitations, we have developed and validated a new signal propagation analysis technique by Digital Lock-in Time Resolved Imaging. It gives a 2D image of propagation time that can be used for accurate analysis of signal propagation.
Keywords :
CMOS image sensors; clocks; data visualisation; electronic engineering computing; image processing; low-power electronics; 2D image; CMOS gate; TRI dimensional data; clock edge; digital lock-in time resolved imaging; low power technology; propagation time; real time imaging; signal propagation analysis; size 45 nm; slice-by-slice visualization; spot chronogram; Image color analysis; Image resolution; Imaging; Inverters; Logic gates; Photonics; Timing;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits (IPFA), 2012 19th IEEE International Symposium on the
Conference_Location :
Singapore
Print_ISBN :
978-1-4673-0980-6
DOI :
10.1109/IPFA.2012.6306321
