Signal propagation analysis by Digital Lock-in Time Resolved Imaging

Author

Bascoul, Guillaume ; Perdu, Philippe ; Lewis, Dean

Author_Institution

CNES, DCT/AQ/LE, Toulouse, France

fYear

2012

fDate

2-6 July 2012

Firstpage

1

Lastpage

5

Abstract

Time Resolved Imaging (TRI) allows real time imaging of transitions in CMOS gates. This technique has been validated down to low power 45 nm technology. TRI is very useful to analyze signal propagation after a clock edge. Nevertheless, TRI dimensional (x, y, t) data are not well adapted for direct visualization of propagation times: (x, y, t) data allows either a movie output or a slice by slice visualization for each time step or a chosen spot chronograms. To overcome these limitations, we have developed and validated a new signal propagation analysis technique by Digital Lock-in Time Resolved Imaging. It gives a 2D image of propagation time that can be used for accurate analysis of signal propagation.

Keywords

CMOS image sensors; clocks; data visualisation; electronic engineering computing; image processing; low-power electronics; 2D image; CMOS gate; TRI dimensional data; clock edge; digital lock-in time resolved imaging; low power technology; propagation time; real time imaging; signal propagation analysis; size 45 nm; slice-by-slice visualization; spot chronogram; Image color analysis; Image resolution; Imaging; Inverters; Logic gates; Photonics; Timing;

fLanguage

English

Publisher

ieee

Conference_Titel

Physical and Failure Analysis of Integrated Circuits (IPFA), 2012 19th IEEE International Symposium on the

Conference_Location

Singapore

ISSN

1946-1542

Print_ISBN

978-1-4673-0980-6

Type

conf

DOI

10.1109/IPFA.2012.6306321

Filename

6306321