DocumentCode :
572423
Title :
The knowledge of business intelligence
Author :
Holsapple, Clyde W.
Author_Institution :
Gatton College of Business and Economics, University of Kentucky, Lexington, USA
fYear :
2012
fDate :
25-28 June 2012
Firstpage :
9
Lastpage :
10
Abstract :
Summary form only given. Charge pumping (CP) is a well-known technique for electrical characterization of semiconductor-insulator interface traps. It has been proposed more than four decades ago and applies primarily to MOSFETs as it requires the switching of the device between inversion and accumulation. Until now, it has therefore been mainly used to study the Si-SiO2 system and accompanied MOSFET scaling.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Technology Interfaces (ITI), Proceedings of the ITI 2012 34th International Conference on
Conference_Location :
Cavtat, Dubrovnik
ISSN :
1334-2762
Print_ISBN :
978-1-4673-1629-3
Type :
conf
DOI :
10.2498/iti.2012.0484
Filename :
6307969
Link To Document :
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