Title :
The knowledge of business intelligence
Author :
Holsapple, Clyde W.
Author_Institution :
Gatton College of Business and Economics, University of Kentucky, Lexington, USA
Abstract :
Summary form only given. Charge pumping (CP) is a well-known technique for electrical characterization of semiconductor-insulator interface traps. It has been proposed more than four decades ago and applies primarily to MOSFETs as it requires the switching of the device between inversion and accumulation. Until now, it has therefore been mainly used to study the Si-SiO2 system and accompanied MOSFET scaling.
Conference_Titel :
Information Technology Interfaces (ITI), Proceedings of the ITI 2012 34th International Conference on
Conference_Location :
Cavtat, Dubrovnik
Print_ISBN :
978-1-4673-1629-3
DOI :
10.2498/iti.2012.0484