• DocumentCode
    572423
  • Title

    The knowledge of business intelligence

  • Author

    Holsapple, Clyde W.

  • Author_Institution
    Gatton College of Business and Economics, University of Kentucky, Lexington, USA
  • fYear
    2012
  • fDate
    25-28 June 2012
  • Firstpage
    9
  • Lastpage
    10
  • Abstract
    Summary form only given. Charge pumping (CP) is a well-known technique for electrical characterization of semiconductor-insulator interface traps. It has been proposed more than four decades ago and applies primarily to MOSFETs as it requires the switching of the device between inversion and accumulation. Until now, it has therefore been mainly used to study the Si-SiO2 system and accompanied MOSFET scaling.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Technology Interfaces (ITI), Proceedings of the ITI 2012 34th International Conference on
  • Conference_Location
    Cavtat, Dubrovnik
  • ISSN
    1334-2762
  • Print_ISBN
    978-1-4673-1629-3
  • Type

    conf

  • DOI
    10.2498/iti.2012.0484
  • Filename
    6307969
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=572423