DocumentCode :
57264
Title :
Feasibility Study of Time-of-Flight Compton Scatter Imaging Using Picosecond Length X-Ray Pulses
Author :
Calvert, Nick ; Betcke, Marta M. ; Deacon, Alick N. ; Gleeson, Anthony J. ; Hill, Christopher ; McIntosh, Peter A. ; Mitchell, Lawrence O. ; Morton, Edward J. ; Ollier, James ; Procter, Mark G. ; Speller, Robert D.
Author_Institution :
Univ. Coll. London, London, UK
Volume :
61
Issue :
6
fYear :
2014
fDate :
Dec. 2014
Firstpage :
3701
Lastpage :
3710
Abstract :
By measuring the time of flight of scattered X-ray photons, the point of interaction, assuming a single scatter, can be determined, providing 3-D information about an object under inspection. This paper describes experimental ToF Compton scatter measurements conducted at the versatile electron linear accelerator (VELA), a picosecond pulsewidth electron source situated in Daresbury, U.K. The ToF of scattered X-ray photons was measured using a CeBr3 detector, and a full width at half maximum (FWHM) of between 29 and 36 cm was achieved with a 5-cm-thick plastic test object. By implementing a low-energy cutoff, the FWHM was reduced to between 12 and 26 cm. Two test objects placed in series with a 50-cm space between were separable in the data after applying the low energy cutoff.
Keywords :
Compton effect; electron accelerators; electron sources; linear accelerators; time of flight spectra; CeBr3 detector; ToF Compton scatter measurements; VELA; picosecond length X-ray pulses; picosecond pulsewidth electron source; plastic test object; scattered X-ray photons; time-of-flight Compton scatter imaging; versatile electron linear accelerator; Deconvolution; Image analysis; Spatial resolution; X-ray imaging; X-ray scattering; Cargo security; X-ray scattering; time of flight (ToF);
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2014.2367239
Filename :
6966805
Link To Document :
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