• DocumentCode
    572792
  • Title

    Ion diode diagnostics to resolve beam quality issues

  • Author

    Bluhm, H. ; Arzhannikov, A. ; Buth, L. ; Hoppe, P. ; Licht, V. ; Matveenko, A. ; Rusch, D. ; Stoltz, O. ; Singer, J. ; Singleton, Colin ; Tauschwitz, A. ; Vath, W. ; Yoo, Sang-Im

  • Author_Institution
    Forschungszentrum Karlsruhe, Institut für Neutronenphysik und Reaktortechnik, Postfach 3640, 76021, Germany
  • Volume
    2
  • fYear
    1996
  • fDate
    10-14 June 1996
  • Firstpage
    1127
  • Lastpage
    1130
  • Abstract
    Various diagnostic methods and instruments are under development at FZK to measure important physical quantities in the accelerating gap of high power ion diodes on KALIF with high spatial and temporal resolution. These methods include optical spectroscopy, refractive index measurements, dispersion interferometry, and high resolution ion energy analysis. The paper describes the set-up of these diagnostics and first results obtained for applied arid selfrnagnetically insulated diodes.
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    High-Power Particle Beams, 1996 11th International Conference on
  • Conference_Location
    Prague, Czech Republic
  • Print_ISBN
    978-80-902250-3-9
  • Type

    conf

  • Filename
    6308539
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=572792