DocumentCode :
573610
Title :
On the functional test of L2 caches
Author :
Riga, M. ; Sanchez, E. ; Reorda, M. Sonza
Author_Institution :
Dipt. di Autom. e Inf., Politec. di Torino, Turino, Italy
fYear :
2012
fDate :
27-29 June 2012
Firstpage :
84
Lastpage :
90
Abstract :
Caches are crucial components in today´s processors (both stand-alone or integrated into SoCs) and they account for a growing percentage of the occupied silicon area. Therefore, their test (both at the end of the manufacturing and on-line) is crucial for the quality and reliability of the whole product. While in many cases cache test is based on Design for Testability (DfT) techniques, there are situations in which the functional approach is the only viable one. Previous papers addressed the issue of developing test programs for testing caches: since the constant trend is to organize them in different levels, in this paper we address the test of second level caches (L2). To the best of our knowledge, the paper presents the first functional test method for L2 caches: some experimental results also are provided to assess its effectiveness on the OpenSPARC T1 processor.
Keywords :
cache storage; design for testability; integrated circuit reliability; integrated circuit testing; DfT techniques; L2 cache functional test approach; OpenSPARC T1 processor; design for testability techniques; reliability; second level cache testing; silicon area; Design for testability; Manufacturing; Program processors; Reliability; Silicon; System-on-a-chip; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2012 IEEE 18th International
Conference_Location :
Sitges
Print_ISBN :
978-1-4673-2082-5
Type :
conf
DOI :
10.1109/IOLTS.2012.6313846
Filename :
6313846
Link To Document :
بازگشت