Title :
Algorithmic techniques for robust applications
Author_Institution :
Univ. of Illinois, Champaign, IL, USA
Abstract :
Summary form only given. Much recent research suggests significant power and energy benefits of relaxing correctness constraints in future processors. Such processors with relaxed constraints have often been referred to as stochastic processors. In this talk, I will discuss three approaches for building applications for such processors. The first approach relies on relaxing the correctness of the application based upon an analysis of application characteristics. The second approach relies upon detecting and then correcting faults within the application as they arise. The third approach transforms applications into more error tolerant forms. In this paper, we show how these techniques that enhance or exploit the error tolerance of applications can yield significant power and energy benefits when computed on stochastic processors.
Keywords :
fault diagnosis; fault tolerance; integrated circuit reliability; algorithmic techniques; application characteristic analysis; error tolerant; fault correction; fault detection; fault tolerance; future processors; relaxed constraints; stochastic processors; Abstracts; Buildings; Educational institutions; Program processors; Robustness;
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2012 IEEE 18th International
Conference_Location :
Sitges
Print_ISBN :
978-1-4673-2082-5
DOI :
10.1109/IOLTS.2012.6313865