Title :
W-band MMIC amplifiers based on 50-nm dual-gate InP HEMT
Author :
Yao, Hongfei ; Cao, Yuxiong ; Wang, Xiantai ; Zhong, Yinghui ; Jin, Zhi
Author_Institution :
Inst. of Microelectron., Beijing, China
Abstract :
Two MMIC amplifiers have been developed in coplanar technology using 50-nm InAlAs/InGaAs HEMTs. The first is a sing-stage amplifier which used balanced double-stub matching networks for both input and output impedances matching. Measured gain is 8.2 dB @ 81.3 GHz, and the 3-dB bandwidth is at least 13.7 GHz. The second is a two-stage common-source power amplifier. A “#” type distributed transmission line networks has been developed and applied to inter-stage and output stage matching networks. This technique propose a new and efficient approach for impedance matching between transistors where DC blocking and separate bias supplies to the active devices are required. Measured gain is 10.1 dB @ 84 GHz and the 3-dB bandwidth is 14.7 GHz. The saturated power is 11.6 dBm @ 85 GHz, 3.6 dB higher than the above-mentioned single-HEMT amplifier. Measured data are in agreement with the simulation results.
Keywords :
III-V semiconductors; MMIC amplifiers; aluminium compounds; gallium arsenide; impedance matching; indium compounds; millimetre wave amplifiers; power amplifiers; transistors; transmission lines; # type distributed transmission line network; InAlAs-InGaAs; W-band MMIC amplifier; balanced double-stub matching network; bandwidth 14.7 GHz; common-source power amplifier; coplanar technology; dual-gate InP HEMT; frequency 81.3 GHz; frequency 84 GHz; frequency 85 GHz; gain 8.2 dB; impedance matching; inter-stage matching network; output stage matching network; sing-stage amplifier; size 50 nm; transistor; Frequency measurement; Gain; HEMTs; Indium phosphide; MMICs; Power amplifiers; Transmission line measurements; HEMT; InP; Power amplifier;
Conference_Titel :
Millimeter Waves (GSMM), 2012 5th Global Symposium on
Conference_Location :
Harbin
Print_ISBN :
978-1-4673-1302-5
DOI :
10.1109/GSMM.2012.6313996