DocumentCode :
57364
Title :
Application of the Transmission-Line Super Theory to Multiwire TEM-Waveguide Structures
Author :
Rambousky, Ronald ; Nitsch, Jurgen B. ; Garbe, Heyno
Author_Institution :
Bundeswehr Res. Inst. for Protective Technol. & NBC Protection, Munster, Germany
Volume :
55
Issue :
6
fYear :
2013
fDate :
Dec. 2013
Firstpage :
1311
Lastpage :
1319
Abstract :
Open TEM-waveguides are often realized by multiwire structures instead of conducting planes. Especially for large-scale nuclear electromagnetic pulse (NEMP) simulators the wire structure is common. In this paper, a generic open TEM-waveguide structure is analyzed using the transmission-line super theory (TLST). The concept of the numerical implementation is thoroughly described independent of a particular programming language. The TLST comprises full Maxwell´s equations assuring that higher order modes and radiation effects are included. Currents along the lines and the total radiated power outside the simulator are calculated. Inside the simulator the magnetic field is estimated in the working volume, and the result is verified by experiment. The presented theory is applicable not only to the described simulator structure but also to a variety of wire-based problems in electromagnetic compatibility.
Keywords :
Maxwell equations; electromagnetic compatibility; magnetic fields; transmission lines; waveguides; conducting planes; electromagnetic compatibility; full Maxwell´s equations; generic open TEM-waveguide structure; higher order modes; large-scale nuclear electromagnetic pulse simulators; magnetic field; multiwire TEM-waveguide structures; programming language; radiation effects; total radiated power; transmission-line super theory; wire structure; wire-based problems; Approximation methods; Equations; Mathematical model; Transmission line matrix methods; Transmission lines; Vectors; Wires; Matrizant; TEM-waveguides; radiation; thin wire approximation; transmission-line super theory;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/TEMC.2013.2259631
Filename :
6515340
Link To Document :
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