DocumentCode :
573655
Title :
Evaluation of envelope-domain dynamic X-parameter model based on variable-carrier-frequency analysis
Author :
Zhang, Yichi ; Lin, Maoliu
Author_Institution :
Sch. of Electron. Inf. Eng., Harbin Inst. of Technol., Harbin, China
fYear :
2012
fDate :
27-30 May 2012
Firstpage :
236
Lastpage :
240
Abstract :
This paper studies the envelope-domain dynamic X-parameter model of RF power-amplifier nonlinear behavior. Based on the analysis of its fundamental assumptions and the main applications for inter-modulation predictions, the consideration of model sensibility to variable carrier-frequency is proposed as one criterion to evaluate the reasonableness of the mathematical modeling. The experimental results in this paper show that the dynamic X-parameters are compatible with each other only within a small neighborhood around the desired carrier frequency, which on one hand may to some extent reflect the reasonableness of the theory, and on the other hand serve to investigate the validity and limits of dynamic X-parameters from a new perspective.
Keywords :
intermodulation; power amplifiers; radiofrequency amplifiers; RF power-amplifier nonlinear behavior; carrier frequency; envelope-domain dynamic X-parameter model; intermodulation prediction; variable-carrier-frequency analysis; Analytical models; Kernel; Mathematical model; Microwave measurements; Microwave theory and techniques; Predictive models; Radio frequency; behavioral model; carrier frequency; complex envelope; dynamic X-parameters; inter-modulation; long-term memory effect; memory kernel;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Millimeter Waves (GSMM), 2012 5th Global Symposium on
Conference_Location :
Harbin
Print_ISBN :
978-1-4673-1302-5
Type :
conf
DOI :
10.1109/GSMM.2012.6314044
Filename :
6314044
Link To Document :
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