Title :
Oscillation-synchronous control of a frequency-measuring atomic force microscope
Author :
Amin-Shahidi, D. ; Trumper, D.L.
Author_Institution :
Mech. Eng. Dept., Massachusetts Inst. of Technol., Cambridge, MA, USA
Abstract :
We present a frequency-measuring atomic force microscope (AFM) system which uses a novel oscillation-synchronous period-feedback controller. Execution of the AFM´s control algorithm synchronously to the tip oscillation allows low-noise and high-precision surface tracking. We use a digital FPGA-based controller to implement this control technique. We use simulation and experimental results to demonstrate the effectiveness of this method.
Keywords :
atomic force microscopy; digital control; feedback; field programmable gate arrays; frequency control; frequency measurement; oscillations; sensors; AFM control algorithm; digital FPGA-based controller; frequency-measuring AFM system; frequency-measuring atomic force microscope system; high-precision surface tracking; low-noise surface tracking; oscillation-synchronous period-feedback controller; self-sensing AFM probe; Bandwidth; Frequency control; Frequency measurement; Noise; Oscillators; Probes; Resonant frequency;
Conference_Titel :
American Control Conference (ACC), 2012
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4577-1095-7
Electronic_ISBN :
0743-1619
DOI :
10.1109/ACC.2012.6314953
