• DocumentCode
    57481
  • Title

    Displacement Sensing by Repetition Rate Pulling in a Passively Mode Locked Laser Under Feedback

  • Author

    Simos, Christos ; Simos, Hercules ; Nikas, Thomas ; Syvridis, Dimitris

  • Author_Institution
    Dept. of Electron. Eng., Technol. Educ. Inst. of Sterea Hellas, Lamia, Greece
  • Volume
    26
  • Issue
    24
  • fYear
    2014
  • fDate
    Dec.15, 15 2014
  • Firstpage
    2418
  • Lastpage
    2421
  • Abstract
    We propose and experimentally validate a simple displacement sensing technique, which relies on the optical feedback-induced pulling of the repetition rate in a passively mode-locked semiconductor laser. Depending on the setup parameters, different realizations of the technique permit displacement and vibration sensing of the reflecting object. Other physical parameters that modify the optical length of the external cavity could also be measured. The technique is particularly well adapted for fast phenomena and offers a subwavelength theoretical displacement resolution, which is limited only by the RF linewidth of the laser and resolution of the repetition frequency measurement.
  • Keywords
    displacement measurement; laser cavity resonators; laser feedback; laser mode locking; measurement by laser beam; semiconductor lasers; RF linewidth; external cavity; optical feedback-induced pulling; optical length; passively mode-locked semiconductor laser; physical parameters; reflecting object; repetition frequency measurement resolution; repetition rate pulling; setup parameters; simple displacement sensing technique; subwavelength theoretical displacement resolution; vibration sensing; Cavity resonators; Frequency measurement; Laser feedback; Laser mode locking; Measurement by laser beam; Optical feedback; Semiconductor lasers; Mode locked lasers; displacement measurement; optical feedback; semiconductor lasers;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2014.2354694
  • Filename
    6892952