Title :
Differential fault analysis on AES by round reduction
Author :
Bae, KiSeok ; Moon, SangJae ; Choi, Dooho ; Choi, YongJe ; Choi, Doo-sik ; Ha, JaeCheol
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Kyungpook Nat. Univ., Daegu, South Korea
fDate :
Nov. 29 2011-Dec. 1 2011
Abstract :
This paper presents a practical differential fault analysis method for the Advanced Encryption Standard (AES) with a reduced round using a semi-invasive fault injection. We adapt the round reduction fault technique on AES in order to skip the 9-th round operation. We can deduce the AES 128-bit secret key using 216 exhaustive searches with two pairs of correct and faulty ciphertexts. We also verified the feasibility of our proposed DFA by a fault injection experiment on ATmega128 microcontroller chip.
Keywords :
cryptography; fault diagnosis; microcontrollers; 216 exhaustive search; 9-th round operation; AES; ATmega128 microcontroller chip; DFA; advanced encryption standard; ciphertext; differential fault analysis method; round reduction fault technique; semiinvasive fault injection experiment; word length 128 bit; Classification algorithms; Doped fiber amplifiers; Encryption; Laser beams; Microcontrollers; Standards; AES; Fault Injection attack; Round reduction;
Conference_Titel :
Computer Sciences and Convergence Information Technology (ICCIT), 2011 6th International Conference on
Conference_Location :
Seogwipo
Print_ISBN :
978-1-4577-0472-7
