DocumentCode
57628
Title
SEE Measurements and Simulations Using Mono-Energetic GeV-Energy Hadron Beams
Author
Alia, R. Garcia ; Brugger, M. ; Danzeca, S. ; Ferlet-Cavrois, Veronique ; Poivey, C. ; Roed, Ketil ; Saigne, F. ; Spiezia, G. ; Uznanski, Slawosz ; Wrobel, F.
Author_Institution
CERN, Geneva, Switzerland
Volume
60
Issue
6
fYear
2013
fDate
Dec. 2013
Firstpage
4142
Lastpage
4149
Abstract
Single Event Upset (SEU) measurements were performed on the ESA SEU Monitor using mono-energetic GeV-energy hadron beams available in the North Experimental Area at CERN. A 400 GeV proton beam in the H4IRRAD test area and a 120 GeV mixed pion and proton beam at the CERN-EU high Energy Reference Field facility (CERF) were used for this purpose. The resulting cross section values are presented and discussed as well as compared to the several hundred MeV case (typical for standard test facilities) from a physical interaction perspective with the intention of providing a more general understanding of the behavior. Moreover, the implications of the cross section dependence with energy above the several hundred MeV range are analyzed for different environments. In addition, analogous measurements are proposed for Single Event Latchup (SEL), motivated by discussed simulation results. Finally, a brief introduction of the future CHARM (CERN High-energy AcceleratoR Mixed facility) test installation is included.
Keywords
hadrons; nuclear electronics; pions; proton effects; radiation hardening (electronics); H4IRRAD test area; cross section values; electron volt energy 120 GeV; electron volt energy 400 GeV; mixed pion proton beam; mono-energetic GeV-energy hadron beams; proton beam; single event latchup; single event upset measurements; Measurement uncertainty; Mesons; Particle accelerators; Protons; Single event upsets; ESA monitor; FLUKA; RadMon; SEU; high energy hadron; pion induced errors;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2013.2279690
Filename
6636115
Link To Document