Title :
ASIC package design optimization for 10 Gbps and above backplane serdes links
Author :
Lim, Jane ; Chow, Kai Soon ; Zhang, Ji ; Zhang, Jianmin ; Qiu, Kelvin ; Brooks, Rick
Author_Institution :
Cisco Syst., Inc., San Jose, CA, USA
Abstract :
This paper discussed the package selection and BGA signal pin assignment consideration for high-end ASIC design with over 400 SerDes (Serializer Deserializer) pairs for >;10Gbps backplane interface. The ASIC package is using advanced high-performance organic build-up (BU) materials like GX13, GZ41 and thinner core in the stack-up to help reduce the package loss and improve the signal transmission on the highspeed SerDes links. For return loss and insertion loss studies, the main objectives are to investigate the core thickness, BU material properties, and routing configurations impact on the differential signalling. The design suggestions are then made at each area for performance and cost optimization. For crosstalk studies, various pin-out patterns for transmit to transmit or receive to receive signals, and transmit to receive signals, have been designed and studied to investigate signal coupling and PCB escape routing requirements. Both frequency and time domain simulations are performed to compare the signal isolation performance. The most optimized pin-out is then selected to achieve the overall required system performance. Lastly, various package substrate samples with different BU materials, core thicknesses and crosstalk structures are manufactured to validate package design performance using probe station technique.
Keywords :
application specific integrated circuits; ball grid arrays; frequency-domain analysis; integrated circuit design; integrated circuit packaging; network routing; time-domain analysis; ASIC package design optimization; BGA signal pin assignment; PCB escape routing; backplane serdes links; ball grid arrays; bit rate 10 Gbit/s; core thickness; cost optimization; differential signalling; frequency domain simulations; insertion loss; organic build-up materials; package loss; package selection; package substrate samples; pin-out patterns; probe station technique; return loss; routing configurations; serializer deserializer; signal coupling; signal isolation performance; signal transmission; time domain simulations; Couplings; Crosstalk; Dielectric losses; Insertion loss; Loss measurement; Materials; Routing;
Conference_Titel :
Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium on
Conference_Location :
Pittsburgh, PA
Print_ISBN :
978-1-4673-2061-0
DOI :
10.1109/ISEMC.2012.6351784