• DocumentCode
    576381
  • Title

    Opportunities for improved 80%/80% statistical methods with CISPR 32

  • Author

    Kolb, Lowell

  • Author_Institution
    Hewlett-Packard Co., Fort Collins, CO, USA
  • fYear
    2012
  • fDate
    6-10 Aug. 2012
  • Firstpage
    457
  • Lastpage
    461
  • Abstract
    CISPR 22 and CISPR 32 both require statistical compliance, specifically that products demonstrate with at least 80% confidence that at least 80% of the product population passes the radiated and conducted emissions limits. There have been problems applying the statistical test specified in CISPR 22 to real products because the method assumes a normal distribution, and products often exhibit characteristics which do not fit that model. For example, if the shielding or grounding in electronic equipment is not consistent unit to unit, it can result in bimodal or multi-modal distributions of some emissions. The bimodal distribution may be a common cause behind signal frequencies which appear as significant emissions in some units but are unmeasurable in others. CISPR 32 introduces more options for tools which may be used to demonstrate 80/80 compliance, notably the binomial distribution test, which is robust enough to accommodate a wide variety of population distributions. When CISPR 32 replaces CISPR 22 as the emissions standard, this binomial test method should be available for product qualifications.
  • Keywords
    air pollution control; machinery production industries; normal distribution; production equipment; standards; statistical testing; CISPR 22 standard; CISPR 32 standard; bimodal distribution; binomial test; confidence; electronic equipment; emission limit; emission standard; multimodal distribution; normal distribution; product population; product qualification; signal frequency; statistical compliance; statistical methods; statistical test; Floors; Gaussian distribution; Graphics; Noise; Sociology; Standards; Statistics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium on
  • Conference_Location
    Pittsburgh, PA
  • ISSN
    2158-110X
  • Print_ISBN
    978-1-4673-2061-0
  • Type

    conf

  • DOI
    10.1109/ISEMC.2012.6351834
  • Filename
    6351834