Dynamic electrothermal analysis of bipolar devices and circuits relying on multi-port positive fraction Foster representation

Author

d´Alessandro, Vincenzo ; de Magistris, M. ; Magnani, A. ; Rinaldi, N. ; Russo, S.

Author_Institution

Dept. of Biomed., Univ. of Naples Federico II, Naples, Italy

fYear

2012

fDate

Sept. 30 2012-Oct. 3 2012

Firstpage

1

Lastpage

4

Abstract

In this paper, a novel multi-port RC network is proposed to describe the dynamic thermal feedback in bipolar devices/circuits with multiple heat sources. The parameters of the circuit can be reliably identified by standard electrical macro-modeling techniques. The representation is shown to be more compact than the usual Foster topology due to the limited number of dynamic elements. The approach is successfully applied to predict thermally-triggered hogging phenomena in basic bipolar differential amplifiers subject to considerable thermal effects.

Keywords

bipolar integrated circuits; network topology; Foster topology; bipolar circuits relying on multi-port positive fraction Foster representation; bipolar devices/circuits; dynamic electrothermal analysis; dynamic thermal feedback; multi-port RC network; multiple heat sources; thermal effects; thermally-triggered hogging phenomena; Heating; Impedance; Integrated circuit modeling; Standards; Topology; Transistors; Differential pair; Foster representation; electrical macro-modeling; silicon germanium; silicon-on-glass; thermal feedback; thermal impedance;

fLanguage

English

Publisher

ieee

Conference_Titel

Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2012 IEEE

Conference_Location

Portland, OR

ISSN

1088-9299

Print_ISBN

978-1-4673-3020-6

Type

conf

DOI

10.1109/BCTM.2012.6352621

Filename

6352621