• DocumentCode
    576682
  • Title

    Differential signal source chips at 150 GHz and 220 GHz in SiGe bipolar technologies based on Gilbert-Cell frequency doublers

  • Author

    Bredendiek, Christian ; Pohl, Nils ; Aufinger, Klaus ; Bilgic, Attila

  • Author_Institution
    Ruhr-Univ. Bochum, Bochum, Germany
  • fYear
    2012
  • fDate
    Sept. 30 2012-Oct. 3 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper presents two differential signal source chips for 150 GHz and 220 GHz in SiGe:C bipolar technologies. The presented architectures consist of a fundamental VCO with a frequency doubling output stage based on the differential Gilbert-Cell. The 150 GHz chip is fabricated in a production technology with an fT of 170 GHz and fmax of 250 GHz, the 220 GHz in an advanced laboratory technology with fT/fmax = 240 GHz/380 GHz. The main goal of this work is to achieve signal sources near the cut-off frequencies of the used technologies with differential outputs. The signal sources achieve a relative 3 dB bandwidth of >; 20% with an output power of 0 dBm and -6 dBm for the 150 GHz chip and 220 GHz chip, respectively. The power consumptions are kept at a moderate level with 430 mW for the 150 GHz chip and 580 mW for the 220 GHz chip from a 5 V supply.
  • Keywords
    Ge-Si alloys; bipolar MIMIC; carbon; frequency multipliers; signal sources; voltage-controlled oscillators; Gilbert-Cell frequency doubler; SiGe:C; VCO; bipolar technology; differential signal source chips; frequency 150 GHz; frequency 170 GHz; frequency 220 GHz; frequency 250 GHz; power 430 mW; power 580 mW; presented architectures consist; voltage 5 V; voltage-controlled oscillator; Frequency measurement; Phase noise; Power generation; Semiconductor device measurement; Silicon germanium; Tuning; Voltage-controlled oscillators; Frequency doubler; MMICs; SiGe bipolar ICs; millimeter-wave VCOs; ultra-wideband;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2012 IEEE
  • Conference_Location
    Portland, OR
  • ISSN
    1088-9299
  • Print_ISBN
    978-1-4673-3020-6
  • Type

    conf

  • DOI
    10.1109/BCTM.2012.6352640
  • Filename
    6352640