Title :
Time series of COSMO-SkyMed data for landcover classification and surface parameter retrieval over agricultural sites
Author :
Mattia, Francesco ; Satalino, Giuseppe ; Balenzano, Anna ; D´Urso, Guido ; Capodici, Fulvio ; Iacobellis, Vito ; Milella, Pamela ; Gioia, Andrea ; Rinaldi, Michele ; Ruggieri, Sergio ; Dini, Luigi
Author_Institution :
Ist. di Studi sui Sist. Intell. per l´´Autom. (ISSIA), Bari, Italy
Abstract :
This paper reports on the results of an Italian project aimed at investigating the use of X-band COSMO-SkyMed (CSK) SAR data for applications in agriculture and hydrology. Existing classification and retrieval algorithms have been tailored to CSK data and time series of crop, leaf area index and soil moisture maps have been retrieved and assessed through the comparison with in situ data collected over three agricultural sites. In addition, the CSK-derived surface parameters have been integrated into crop growth and hydrologic models and the resulting improvements have been assessed. Results indicate that multi-temporal dual-polarized CSK data are very well-suited for agricultural crop classification and that the integration of maps of SAR-derived surface parameters into crop growth and/or hydrologic models, in general, leads to significant improvements in the model performances.
Keywords :
geophysical image processing; geophysical techniques; image classification; remote sensing by radar; synthetic aperture radar; vegetation; vegetation mapping; CSK data; CSK-derived surface parameters; Italian project; X-band COSMO-SkyMed SAR data; agricultural crop classification; agricultural sites; classification algorithm; crop growth; crop time series; hydrologic models; landcover classification; leaf area index; multitemporal dual-polarized CSK data; retrieval algorithm; soil moisture maps; surface parameter retrieval; Agriculture; Data models; Decision support systems; Indexes; Soil moisture; Stress; Time series analysis; COSMO-SkyMed; SAR; X-band;
Conference_Titel :
Geoscience and Remote Sensing Symposium (IGARSS), 2012 IEEE International
Conference_Location :
Munich
Print_ISBN :
978-1-4673-1160-1
Electronic_ISBN :
2153-6996
DOI :
10.1109/IGARSS.2012.6352738