• DocumentCode
    576737
  • Title

    Total Dose and Single Event Testing of the Intersil ISL75051SRH Low Dropout Regulator

  • Author

    van Vonno, N.W. ; Pearce, L.W. ; Knudsen, K.C. ; Thomson, E.J. ; Bernard, T.M. ; Chesley, P.J.

  • Author_Institution
    High Reliability Products Group, Intersil Corp., Melbourne, FL, USA
  • fYear
    2012
  • fDate
    16-20 July 2012
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    We report the results of low and high dose rate total dose and SEE testing of the Intersil ISL75051SRH low dropout regulator together with a discussion of the part´s electrical specifications and wafer fabrication process.
  • Keywords
    integrated circuit testing; Intersil ISL75051SRH low dropout regulator; electrical specification; single event testing; total dose; wafer fabrication process; Aggregates; Histograms; Ions; Radiation effects; Regulators; Testing; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2012 IEEE
  • Conference_Location
    Tucson, AZ
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4673-2730-5
  • Type

    conf

  • DOI
    10.1109/REDW.2012.6353708
  • Filename
    6353708
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=576737