Title :
Total Dose and Single Event Testing of the Intersil ISL75051SRH Low Dropout Regulator
Author :
van Vonno, N.W. ; Pearce, L.W. ; Knudsen, K.C. ; Thomson, E.J. ; Bernard, T.M. ; Chesley, P.J.
Author_Institution :
High Reliability Products Group, Intersil Corp., Melbourne, FL, USA
Abstract :
We report the results of low and high dose rate total dose and SEE testing of the Intersil ISL75051SRH low dropout regulator together with a discussion of the part´s electrical specifications and wafer fabrication process.
Keywords :
integrated circuit testing; Intersil ISL75051SRH low dropout regulator; electrical specification; single event testing; total dose; wafer fabrication process; Aggregates; Histograms; Ions; Radiation effects; Regulators; Testing; Transient analysis;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2012 IEEE
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-4673-2730-5
DOI :
10.1109/REDW.2012.6353708
