• DocumentCode
    576741
  • Title

    Single Event Upset Characterization of the Virtex-6 Field Programmable Gate Array Using Proton Irradiation

  • Author

    Hiemstra, David M. ; Kirischian, Valeri

  • Author_Institution
    MDA, Brampton, ON, Canada
  • fYear
    2012
  • fDate
    16-20 July 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Proton induced SEU cross-sections of the SRAM which stores the logic configuration and certain functional blocks of the Virtex-6 FPGA are presented. Upset rates in the space radiation environment are estimated.
  • Keywords
    SRAM chips; field programmable gate arrays; SRAM; Virtex-6 FPGA; Virtex-6 field programmable gate array; functional blocks; logic configuration; proton irradiation; single event upset characterization; space radiation environment; Field programmable gate arrays; Monitoring; Performance evaluation; Protons; Radiation effects; Random access memory; Single event upset;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2012 IEEE
  • Conference_Location
    Tucson, AZ
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4673-2730-5
  • Type

    conf

  • DOI
    10.1109/REDW.2012.6353716
  • Filename
    6353716
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=576741