Title :
SEU, SET, and SEFI Test Results of a Hardened 16Mbit MRAM Device
Author :
Hafer, Craig ; Thun, Matt Von ; Mundie, Michelle ; Bass, Derek ; Sievert, Fred
Author_Institution :
Aeroflex Colorado Springs, Colorado Springs, CO, USA
Abstract :
The SEU, SET, and SEFI heavy ion test results are presented for a 16Mbit MRAM device. The device has been hardened for SEL immunity (≤ 100 MeV·cm2/mg) and TID immunity (≤ 1 Mrad(Si)).
Keywords :
MRAM devices; integrated circuit testing; SEFI heavy ion test; SEL immunity; SET heavy ion test; SEU heavy ion test; TID immunity; hardened MRAM device; single event functional interrupt; single event latchup; single event transient; Arrays; Magnetic fields; Magnetic tunneling; Radiation effects; Single event upset; Springs; Xenon;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2012 IEEE
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-4673-2730-5
DOI :
10.1109/REDW.2012.6353717
