Title :
Compendium of Single-Event Latchup and Total Ionizing Dose Test Results of Commercial Analog to Digital Converters
Author :
Irom, Farokh ; Agarwal, Shri G.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
This paper reports single-event latchup and total ionizing dose results for a variety of analog to digital converters targeted for possible use in NASA spacecraft. The compendium covers devices tested over the last 15 years.
Keywords :
analogue-digital conversion; circuit testing; radiation hardening (electronics); NASA spacecraft; commercial analog-to-digital converters; single-event latchup test; total ionizing dose test; CMOS integrated circuits; Heating; Ions; Performance evaluation; Sensitivity; Temperature measurement; Temperature sensors;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2012 IEEE
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-4673-2730-5
DOI :
10.1109/REDW.2012.6353729
