• DocumentCode
    576746
  • Title

    Compendium of Single-Event Latchup and Total Ionizing Dose Test Results of Commercial Analog to Digital Converters

  • Author

    Irom, Farokh ; Agarwal, Shri G.

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • fYear
    2012
  • fDate
    16-20 July 2012
  • Firstpage
    1
  • Lastpage
    14
  • Abstract
    This paper reports single-event latchup and total ionizing dose results for a variety of analog to digital converters targeted for possible use in NASA spacecraft. The compendium covers devices tested over the last 15 years.
  • Keywords
    analogue-digital conversion; circuit testing; radiation hardening (electronics); NASA spacecraft; commercial analog-to-digital converters; single-event latchup test; total ionizing dose test; CMOS integrated circuits; Heating; Ions; Performance evaluation; Sensitivity; Temperature measurement; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2012 IEEE
  • Conference_Location
    Tucson, AZ
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4673-2730-5
  • Type

    conf

  • DOI
    10.1109/REDW.2012.6353729
  • Filename
    6353729
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=576746