DocumentCode :
576750
Title :
Compendium of Single Event Effects for Candidate Spacecraft Electronics for NASA
Author :
O´Bryan, Martha V. ; LaBel, Kenneth A. ; Pellish, Jonathan A. ; Lauenstein, Jean-Marie ; Chen, Dakai ; Marshall, Cheryl J. ; Casey, Megan C. ; Gigliuto, Robert A. ; Sanders, Anthony B. ; Oldham, Timothy R. ; Kim, Hak S. ; Phan, Anthony M. ; Berg, Melanie
fYear :
2012
fDate :
16-20 July 2012
Firstpage :
1
Lastpage :
9
Abstract :
We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.
Keywords :
radiation hardening (electronics); semiconductor device testing; space vehicle electronics; NASA; SEE testing; candidate spacecraft electronics; electronic radiation effect; single event effect testing; CMOS integrated circuits; Laser beams; NASA; Performance evaluation; Protons; Testing; USA Councils;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2012 IEEE
Conference_Location :
Tucson, AZ
ISSN :
2154-0519
Print_ISBN :
978-1-4673-2730-5
Type :
conf
DOI :
10.1109/REDW.2012.6353739
Filename :
6353739
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=576750
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