DocumentCode
576750
Title
Compendium of Single Event Effects for Candidate Spacecraft Electronics for NASA
Author
O´Bryan, Martha V. ; LaBel, Kenneth A. ; Pellish, Jonathan A. ; Lauenstein, Jean-Marie ; Chen, Dakai ; Marshall, Cheryl J. ; Casey, Megan C. ; Gigliuto, Robert A. ; Sanders, Anthony B. ; Oldham, Timothy R. ; Kim, Hak S. ; Phan, Anthony M. ; Berg, Melanie
fYear
2012
fDate
16-20 July 2012
Firstpage
1
Lastpage
9
Abstract
We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.
Keywords
radiation hardening (electronics); semiconductor device testing; space vehicle electronics; NASA; SEE testing; candidate spacecraft electronics; electronic radiation effect; single event effect testing; CMOS integrated circuits; Laser beams; NASA; Performance evaluation; Protons; Testing; USA Councils;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop (REDW), 2012 IEEE
Conference_Location
Tucson, AZ
ISSN
2154-0519
Print_ISBN
978-1-4673-2730-5
Type
conf
DOI
10.1109/REDW.2012.6353739
Filename
6353739
Link To Document