Title :
Compendium of Total Ionizing Dose and Displacement Damage for Candidate Spacecraft Electronics for NASA
Author :
Cochran, Donna J. ; Boutte, Alvin J. ; Chen, Dakai ; Pellish, Jonathan A. ; Ladbury, Raymond L. ; Casey, Megan C. ; Campola, Michael J. ; Wilcox, Edward P. ; O´Bryan, Martha V. ; LaBel, Kenneth A. ; Lauenstein, Jean-Marie ; Batchelor, David A. ; Oldham, T
Author_Institution :
MEI Technol., Inc., Seabrook, TX, USA
Abstract :
Vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage is studied. Devices tested include optoelectronics, digital, analog, linear, and hybrid devices.
Keywords :
ionisation; space vehicle electronics; NASA; analog device testing; digital device testing; displacement damage; hybrid device testing; linear device testing; optoelectronics device testing; spacecraft electronics; total ionizing dose compendium; Electronic mail; Green products; NASA; Operational amplifiers; Protons; Threshold voltage; USA Councils;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2012 IEEE
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-4673-2730-5
DOI :
10.1109/REDW.2012.6353741
