Numerical Analysis of Ultrafast Performances of All-Optical Logic-Gate Devices Integrated With InAs QD-SOA and Ring Resonators

Author

Matsumoto, Atsushi ; Kuwata, Keichiro ; Matsushita, Asuka ; Akahane, Kouichi ; Utaka, Katsuyuki

Author_Institution

Fac. of Sci. & Eng, Waseda Univ., Tokyo, Japan

Volume

49

Issue

1

fYear

2013

fDate

Jan. 2013

Firstpage

51

Lastpage

58

Abstract

We analytically investigate the ultrafast dynamic behavior of the proposed optical XNOR and and logic gate devices, composed of a monolithically integrated highly stacked InAs quantum dot semiconductor optical amplifier (SOA) and fabricated with the strain compensation technique and ring resonators. The calculated results indicate that the integrated device can operate in the logic gate functions at 160-Gb/s return-to-zero signals with large eye opening, the value of which is estimated to be 90.3%. This is superior to a bulk-type SOA. We show the potential of this device for routing signal processing, such as signal-label recognition in ultrafast photonic network systems.

Keywords

III-V semiconductors; high-speed optical techniques; indium compounds; integrated optoelectronics; laser cavity resonators; monolithic integrated circuits; numerical analysis; optical fabrication; optical logic; quantum dot lasers; semiconductor optical amplifiers; signal processing equipment; QD-SOA; all-optical logic-gate devices; bit rate 160 Gbit/s; integrated device; logic gate functions; monolithically integrated highly stacked quantum dot semiconductor optical amplifier; numerical analysis; optical AND logic gate devices; optical XNOR logic gate devices; return-to-zero signals; ring resonators; signal processing; strain compensation technique; ultrafast dynamic behavior; ultrafast performance; Logic gates; Nonlinear optics; Optical ring resonators; Probes; Semiconductor optical amplifiers; Optical logic device; quantum dots; ring resonator; semiconductor optical amplifier;

fLanguage

English

Journal_Title

Quantum Electronics, IEEE Journal of

Publisher

ieee

ISSN

0018-9197

Type

jour

DOI

10.1109/JQE.2012.2225095

Filename

6332458