• DocumentCode
    577378
  • Title

    Effect of RE element addition and processing parameters on the shear strength and interfacial IMCs of SAC solder joints

  • Author

    Zhu, Yandan ; Wang, Lifeng ; Liu, Yang ; Lv, Ye

  • Author_Institution
    School of Materials Science and Engineering Harbin University of Science and Technology Harbin, China
  • fYear
    2012
  • fDate
    18-21 Sept. 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The reliability of SAC lead-free solder joints are believed to be greatly influenced by the interfacial intermetallic compounds (IMCs) between solders and substrates. Our previous works investigated the effects of minimal rare earth (RE) elements addition on the interfacial IMCs under different aging time. Experimental results showed that the appropriate RE content is 0.07wt% La in Sn-0.3Ag-0.7Cu (SAC0307). In this paper, the influences of reflow parameters and Ce addition on the IMCs of SAC0307-0.07La/Cu solder joints were studied. The morphologies of IMCs were characterized by metallographic microscope (OM) and scanning electron microscope (SEM). Besides, the shear strength of the solder joints was evaluated by the shear tests. In comparison purpose, all the solder balls were prepared under the same conditions. The results showed that the thicknesses of the IMCs increased following the linear law and the shear strength varied under the parabolic law with the increase of reflow time. Meanwhile, the shear strength of the solder joints increased almost linearly with the increase of the cooling rate. The main failure mode was ductile fracture when the shear speed was 0.05mm/s.
  • Keywords
    ageing; copper alloys; reflow soldering; reliability; scanning electron microscopy; shear strength; silver alloys; solders; tin alloys; IMC; RE element addition; SAC lead-free solder joints reliability; Sn-Ag-Cu; interfacial intermetallic compounds; metallographic microscope; parabolic law; processing parameters; rare earth elements; reflow parameters; reflow time; scanning electron microscope; shear strength; shear tests; solder balls; Compounds; Cooling; Lead; Microstructure; Reliability; Soldering; IMC; Lead-free solder; cooling rate; reflowing time; shear strength;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Strategic Technology (IFOST), 2012 7th International Forum on
  • Conference_Location
    Tomsk
  • Print_ISBN
    978-1-4673-1772-6
  • Type

    conf

  • DOI
    10.1109/IFOST.2012.6357490
  • Filename
    6357490