• DocumentCode
    577387
  • Title

    Thin Ni-YSZ films fabricated by magnetron co-sputtering used as anodes for solid oxide fuel cells

  • Author

    Ionov, I.V. ; Sochugov, N.S. ; Soloviev, A.A. ; Kovalchuk, A.N. ; Tcybenko, A.O. ; Sigfusson, T.I.

  • Author_Institution
    Department of Hydrogen Energy and Plasma Technologies, Tomsk Polytechnic University, Tomsk Russia
  • fYear
    2012
  • fDate
    18-21 Sept. 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Ni-YSZ (YSZ - yttria-stabilized zirconia) films were fabricated by the reactive magnetron co-sputtering of Ni and Zr-Y targets. The maximum deposition rate was 6 μm·h-1. The oxygen flow and the DC power supplied to the Ni target were tuned to study the effect of the deposition conditions on the film properties and to obtain the film with required parameters. The chemical composition and the surface morphology films were studied. The columnar morphology was observed in the as-deposited films. Electrolyte supported solid oxide fuel cells (SOFC) with sputtered anode and brush painted La0.7Sr0.3MnO3 (LSM) cathode were made to study the thin Ni-YSZ anode characteristics. Voltage-current curves of the electrolyte supported SOFCs with the brush painted and the magnetron sputtered Ni-YSZ anode were compared. The maximum power density of the SOFC with the magnetron sputtered anode at 800°C was 210 mW/cm2.
  • Keywords
    anodes; chemical analysis; electrodeposition; electrolytes; painting; solid oxide fuel cells; sputtering; surface morphology; thin films; yttrium compounds; zirconium compounds; DC power; SOFC; anodes; brush painted cathode; chemical composition; columnar morphology; deposition conditions; magnetron cosputtering; maximum deposition rate; maximum power density; oxygen flow; solid oxide fuel cells; surface morphology films; temperature 800 degC; thin yttria-stabilized zirconia films; voltage-current curves; Anodes; Brushes; Films; Nickel; Scanning electron microscopy; Sputtering; Substrates; Ni YSZ anode; SOFC; magnetron sputtering; thin film;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Strategic Technology (IFOST), 2012 7th International Forum on
  • Conference_Location
    Tomsk
  • Print_ISBN
    978-1-4673-1772-6
  • Type

    conf

  • DOI
    10.1109/IFOST.2012.6357501
  • Filename
    6357501