DocumentCode :
577500
Title :
Development of a digital spectrometric system for material studying by positron annihilation techniques
Author :
Bordulev, Yuriy ; Laptev, Roman ; Lider, Andrey ; Kroening, Michael
Author_Institution :
National Research Tomsk Polytechnic University, Tomsk Russia
fYear :
2012
fDate :
18-21 Sept. 2012
Firstpage :
1
Lastpage :
4
Abstract :
Positron annihilation spectroscopy techniques are sensitive laboratory methods of in-depth study of the material structure and processes occurring in it. The digital spectrometric system described in this paper is designed to study the defect structure of materials by positron annihilation spectroscopy techniques. This system combines the methods of positron annihilation lifetime spectroscopy and Doppler broadening spectroscopy. These two techniques can be implemented either in one complex or individually. Application of these experimental techniques simultaneously provides a temporal and energy distribution of annihilation gamma-quanta, i.e. the most comprehensive qualitative and quantitative information of the electronic structure of the substance can be obtained. Using the coincidence γ-γ measurements in the Dopler broadening spectroscopy technique also allows observing the high-momentum part of the spectrum of the annihilation of positrons with deep shell electrons. The analysis of this part of spectrum enables to obtain the information about the chemical composition of the material. In comparison with the traditional analog systems, this system is being developed using modern digital components to ensure the ease of setup and operation of the equipment, as well as enabling the development of the system in order to improve its characteristics.
Keywords :
Doppler broadening; coincidence techniques; gamma-ray detection; particle spectrometers; positron annihilation; γ-γ measurement; Doppler broadening spectroscopy; annihilation gamma-quanta; deep shell electron; digital spectrometric system; energy distribution; material chemical composition; material defect structure; material processing; positron annihilation spectroscopy; substance electronic structure; temporal distribution; Detectors; Doppler effect; Materials; Positrons; Satellite broadcasting; Semiconductor device measurement; Spectroscopy; annihilation; doppler broadening; lifetime; positron; spectrometer;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Strategic Technology (IFOST), 2012 7th International Forum on
Conference_Location :
Tomsk
Print_ISBN :
978-1-4673-1772-6
Type :
conf
DOI :
10.1109/IFOST.2012.6357732
Filename :
6357732
Link To Document :
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