Determination of overlapping peaks heights by tangent method

Author

Larionova, Ekaterina ; Romanenko, Serge

Author_Institution

Department of Human and Life Safety, Institute of Non-Destructive Testing, Tomsk Polytechnic University, Tomsk, Russia

fYear

2012

fDate

18-21 Sept. 2012

Firstpage

1

Lastpage

4

Abstract

In this work the tangent approach is valid on example of overlapping voltammetric peaks of Cd (II) and Tl (I) at their different concentration in a mixture. Height of the frame plotted by inflectional tangents to the inflection points on peak branches is used as a peak maximum for calibration curve plotting. It is founded that systematic errors are not significant for the measurement of Tl (I) peak. In case of the Cd (II) peak the significant systematic error arising from tailing of the ascending part of Tl (I) peak is observed. We propose a method of systematic errors compensation. Systematic errors are estimated by peak series modeling. We use six parametric peak model with help of a priory information about signal shape and real values of resolution criteria and ratios of peaks heights. Peak shape is determined by difference method and ratios of peak heights by calibration curve.

Keywords

cadmium; calibration; chemical variables measurement; measurement errors; mixtures; thallium; voltammetry (chemical analysis); Cd; Tl; calibration curve plotting; inflection point; measurement error; overlapping peak height determination; parametric peak model; peak series modeling; resolution criteria; systematic error estimation; tangent method; Analytical models; Calibration; Measurement uncertainty; Shape; Signal resolution; Standards; Systematics; overlapping peaks; stripping voltammetry; systematic errors; tangent method;

fLanguage

English

Publisher

ieee

Conference_Titel

Strategic Technology (IFOST), 2012 7th International Forum on

Conference_Location

Tomsk

Print_ISBN

978-1-4673-1772-6

Type

conf

DOI

10.1109/IFOST.2012.6357742

Filename

6357742