DocumentCode
577524
Title
Soft x-ray radiation on the microtron electron beam
Author
Uglov, S.R. ; Zabaev, V.N. ; Kuznetsov, S.I.
Author_Institution
Tomsk Polytechnic University, Tomsk, Russia
fYear
2012
fDate
18-21 Sept. 2012
Firstpage
1
Lastpage
3
Abstract
The first results of experimental study of a back transition radiation (BTR) generated by 5.7 MeV electrons in the soft x-ray radiation region are presented. In the experiment the angular distribution (rocking curves) of the yield of radiation generated at the input surfaces of the samples has been measured for thin Si crystal. The radiation was measured by a channel electron multiplier (CEM-6) at the angle θD = 60° with respect to the electron beam direction. The experimental results and the method of extraction of the DTR and PXR contributions are discussed and are compared with the theory. For estimation of the radiation energy structure and the background level are used super thin filters. The analysis of the results testified, that main contributions in the radiation yield depend from the 10-30 eV photons emission.
Keywords
X-rays; electron beams; elemental semiconductors; microtrons; silicon; synchrotron radiation; BTR; CEM-6; DTR extraction; PXR; Si; angular distribution; back transition radiation; background level; channel electron multiplier; electron beam direction; electron volt energy 10 eV to 30 eV; electron volt energy 5.7 MeV; microtron electron beam; photon emission; radiation energy structure; rocking curves; soft X-ray radiation region; super thin filters; synchrotron radiation; thin silicon crystal; Cameras; Detectors; Electron beams; Magnetic noise; Magnetic separation; Magnetic shielding; Optical surface waves; electromagnetic radiation; electron; microtron; surface; synchrotron radiation;
fLanguage
English
Publisher
ieee
Conference_Titel
Strategic Technology (IFOST), 2012 7th International Forum on
Conference_Location
Tomsk
Print_ISBN
978-1-4673-1772-6
Type
conf
DOI
10.1109/IFOST.2012.6357778
Filename
6357778
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