• DocumentCode
    577922
  • Title

    Buried heterostructure VCSEL with semiconductor mirrors

  • Author

    Zhao, G. ; Zhang, Y. ; Deppe, D.G. ; Kronthasinghe, K. ; Muller, A.

  • Author_Institution
    Coll. of Opt. & Photonics, Univ. of Central Florida, Orlando, FL, USA
  • fYear
    2012
  • fDate
    23-27 Sept. 2012
  • Firstpage
    250
  • Lastpage
    251
  • Abstract
    Vertical-cavity surface-emitting lasers (VCSELs) have achieved remarkable performance in threshold, speed, and efficiency. However the VCSELs have so far achieved their performance without the benefit of a buried-heterostructure (BH) gain structure. A high quality BH gain structure can be expected to dramatically improve VCSEL performance by eliminating parasitic charging effects in the perimeter region of the VCSEL´s gain material. The BH is expected to produce lower threshold, higher efficiency, and higher modulation speed for small VCSEL devices. Because many other parameters due to current funneling and heat spreading improve in small size VCSELs, a BH VCSEL could be expected to produce a significantly improved laser performance. However the BH VCSEL requires a design that can also form a high quality cavity, since the VCSEL performance is strongly dependent on cavity loss. These types of designs have not yet been very thoroughly investigated. Here we present to our knowledge the first report of a BH quantum well VCSEL, with the epitaxial growth over InGaAs quantum wells.
  • Keywords
    epitaxial growth; gallium arsenide; indium compounds; laser mirrors; semiconductor quantum wells; surface emitting lasers; buried heterostructure VCSEL; cavity loss; epitaxial growth; gain structure; higher efficiency; higher modulation; lower threshold; quality cavity; semiconductor mirrors; Cavity resonators; Epitaxial growth; Quantum dot lasers; Temperature measurement; Vertical cavity surface emitting lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photonics Conference (IPC), 2012 IEEE
  • Conference_Location
    Burlingame, CA
  • Print_ISBN
    978-1-4577-0731-5
  • Type

    conf

  • DOI
    10.1109/IPCon.2012.6358586
  • Filename
    6358586