Title :
Novel tomography of simultaneous imaging and material characterization by spatially-resolved spectroscopy
Author :
Sakatsume, Masaya ; Mikawa, Yukihiro ; Banh, Tuan Quoc ; Shioda, Tatsutoshi
Author_Institution :
Dept. of Electr. Eng., Nagaoka Univ. of Technol., Nagaoka, Japan
Abstract :
Novel tomography was developed to observe both tomographic imaging and tomographic spectroscopic simultaneously. This method can obtain the electric field spectra of each slice in sample with optical parameters, as complex refractive index, refractivity, transmittance,.
Keywords :
image processing; optical tomography; refractive index; terahertz spectroscopy; complex refractive index; electric field spectra; material characterization; optical parameters; refractivity; spatially-resolved spectroscopy; tomographic imaging; tomographic spectroscopy; Calibration; Mirrors; Optical imaging; Optical interferometry; Optical refraction; Optical variables control; Tomography; Spectroscopy; Tomography; time-domain interferometry; tomographic spectroscopy;
Conference_Titel :
Photonics Conference (IPC), 2012 IEEE
Conference_Location :
Burlingame, CA
Print_ISBN :
978-1-4577-0731-5
DOI :
10.1109/IPCon.2012.6358760
