DocumentCode
57821
Title
Interaction of Metrology and Assembly at W7-X
Author
Braeuer, Tobias ; Havemeister, R. ; Henkel, Achim ; Mueller, Jessica
Author_Institution
Euratom Assoc., Max-Planck-Inst. fuer Plasmaphysik, Greifswald, Germany
Volume
42
Issue
7
fYear
2014
fDate
Jul-14
Firstpage
1943
Lastpage
1950
Abstract
Metrology at W7-X is an integral part of device assembly. Lots of assembly steps are guided by metrology. In addition to that, metrology performs final geometry checks at the end of most of assembly steps. This paper presents some general assembly tolerances and the metrology equipment that found the accuracy basement to gain these tolerances. Exemplified by magnet system assembly, metrology methods used and the alignment as well as the measurement accuracies achieved are presented. It is shown that the final geometric position accuracy of the main field coils meets the requirements at a high quality of the magnet field. A procedure to transfer coordinates from the main coordinate system, fixed on the torus hall building, into the vacuum vessel is given in detail. The accuracy obtained for the coordinate transfer is presented. The first results of in-vessel component assembly are shown with special focus on incoming inspection and the experience gained during installation of fixation elements and wall protection components.
Keywords
fusion reactor divertors; measurement; plasma devices; plasma diagnostics; plasma toroidal confinement; plasma-wall interactions; W7-X assembly; alignment; assembly steps; coordinate transfer; device assembly; fixation elements; general assembly tolerances; geometry checks; in-vessel component assembly; magnet system assembly; metrology equipment; metrology interaction; torus hall building; wall protection components; Accuracy; Assembly; Cascading style sheets; Coils; Inspection; Metrology; Position measurement; Assembly; Wendelstein 7-X.; component; component alignment; metrology; stellarator; wendelstein 7-X;
fLanguage
English
Journal_Title
Plasma Science, IEEE Transactions on
Publisher
ieee
ISSN
0093-3813
Type
jour
DOI
10.1109/TPS.2014.2329098
Filename
6837534
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