• DocumentCode
    57823
  • Title

    Evolution of Leakage Current Paths in MC-Si PV Modules From Leading Manufacturers Undergoing High-Voltage Bias Testing

  • Author

    Dhere, Neelkanth G. ; Shiradkar, Narendra S. ; Schneller, Eric

  • Author_Institution
    Florida Solar Energy Center, Univ. of Central Florida, Cocoa, FL, USA
  • Volume
    4
  • Issue
    2
  • fYear
    2014
  • fDate
    Mar-14
  • Firstpage
    654
  • Lastpage
    658
  • Abstract
    The evolution of leakage currents in photovoltaic modules undergoing outdoor high-voltage bias testing is studied using data from high-voltage bias testing of multicrystalline silicon modules from leading manufacturers. An analysis of the module leakage currents as a function of environmental conditions including temperature, relative humidity, rain, and wetness is carried out. The behavior of the modules was found to be dependent on the module construction and the materials used. The Arrhenius model was used to fit the experimental data and activation energies were computed for various relative humidity values. The effect of dew and rain (wetness) on the front glass was investigated. Changes in the leakage current during dry conditions were studied using the temperature dependence of resistivity of bulk soda-lime glass. Because of the approximately tenfold increase in leakage currents during the wet conditions, it is suggested that the accelerated tests should not be limited exclusively to noncondensing environments but should also be complemented with tests that include wet conditions.
  • Keywords
    elemental semiconductors; humidity; leakage currents; semiconductor device testing; silicon; solar cells; Arrhenius model; MC-Si PV modules; Si; activation energy; bulk soda-lime glass; dew effect; high-voltage bias testing; humidity; leakage current; multicrystalline silicon modules; resistivity; temperature dependence; Glass; Leakage currents; Photovoltaic systems; Rain; Temperature measurement; Testing; Degradation; high-voltage bias; leakage current; photovoltaic (PV) cells; photovoltaic systems; potential-induced degradation; reliability; system voltage stress;
  • fLanguage
    English
  • Journal_Title
    Photovoltaics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    2156-3381
  • Type

    jour

  • DOI
    10.1109/JPHOTOV.2013.2294764
  • Filename
    6710150